High temperature resistivity and Seebeck measurements
The high temperature Seebeck and resistivity setup (HTS) is used for the electrical characterization of thermoelectric thin film samples between room temperature and 450°C under vacuum conditions or in nitrogen atmosphere. The Van der Pauw technique is used for the determination of the electrical conductivity of samples with a size of (10 ± 2) mm × (10 ± 2) mm.
The Seebeck coefficient is done in a two-point-configuration in order to minimize the error of the temperature measurement. Here the sample size is in the range of (14 ± 9) mm × (5 ± 2) mm.
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